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A unified approach to mode splitting and scattering loss in high-Q whispering-gallery-mode microresonators

机译:高Q值模式分裂和散射损耗的统一方法   低语画廊模式微谐振器

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摘要

Current theoretical treatment of mode splitting and scattering loss resultingfrom sub-wavelength scatterers attached to the surface of high-quality-factorwhispering-gallery-mode microresonators is not satisfactory. Different modelshave been proposed for two distinct scatterer regimes, i.e., a-few- andmany-scatterers. In addition, many experimental results seem difficult tounderstand within the existing theoretical framework. Here we develop a unifiedapproach that applies to an arbitrary number of scatterers, which reveals theapplicable conditions and the limits of the existing theoretical models.Moreover, many new understandings on mode splitting and scattering loss havebeen achieved, which are supported by numerical and experimental evidences.Such a unified approach is essential for the fundamental studies as well as thepractical applications of mode splitting and scattering loss inhigh-quality-factor whispering-gallery-mode microresonators.
机译:目前对附着在高质量因子耳语画廊模式微谐振器表面的亚波长散射体引起的模式分裂和散射损耗的理论处理并不令人满意。对于两种不同的散射体,即几个和多个散射体,已经提出了不同的模型。此外,在现有的理论框架内,许多实验结果似乎难以理解。这里我们开发了一种适用于任意数量的散射体的统一方法,揭示了现有理论模型的适用条件和局限性,此外,在模式分裂和散射损耗方面取得了许多新的认识,并得到了数值和实验证据的支持。这种统一的方法对于高质量因子耳语画廊模式微谐振器的基础研究以及模式分裂和散射损耗的实际应用至关重要。

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